AFM Calibration

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Showing 1–12 of 14 results

  • TGQ1

    TGQ1

    TGQ1

    $350.00

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    Description

    TGQ calibration gratings are intended for simultaneous calibration in X, Y, and Z directions, lateral calibration of AFM scanners, and detection of lateral nonlinearity, hysteresis, creep and cross-coupling effects.

  • TGT1

    TGT1

    TGT1

    $350.00

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    Description

    TGT calibration gratings allow users to visualize scanning tips in 3-D, determine tip sharpness parameters (aspect ratio and curvature radius), tip degradation and contamination control.

  • TGS1F

    Description

    Grating set for Z-axis SPM calibration with four different height ranges – 20nm, 110nm, 520nm, 1400nm. This set includes TGZ1, TGZ2, TGZ3, and TGZ4.

  • TGS1

    TGS1

    $280.00

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    Description

    Grating set for Z-axis SPM calibration with three different height ranges – 20nm, 110nm, 520nm. This set includes TGZ1, TGZ2, and TGZ3.

  • TGZ1

    TGZ1

    TGZ1

    $115.00

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    Description

    TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.

  • TGS2

    TGS2

    $550.00

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    Description

    Grating set for SPM lateral and vertical calibration. This set includes TGZ1, TGZ2, TGZ3, TGX1, TGG1, and TGT1.

  • TDG01

    TDG01

    TDG01

    $340.00

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    Description

    Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.

  • TGG1

    TGG1

    TGG1

    $220.00

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    Description

    TGG calibration gratings are intended for AFM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, and tip characterization.

  • TGZ3

    TGZ3

    TGZ3

    $115.00

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    Description

    TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.

  • TGZ2

    TGZ2

    TGZ2

    $115.00

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    Description

    TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.

  • TGL1

    TGL1

    TGL1

    $350.00

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    Description

    Calibration grating for 2-D and 3-D calibration

  • TGSFull

    TGSFull

    $1,250.00

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    Description

    Full set of calibration standards for AFM simultaneous calibration in X, Y, and Z directions; submicron SPM calibration in X or Y direction; lateral and vertical calibration. This set includes TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, and TGQ1.