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High Aspect Ratio SCD Probes
High Aspect Ratio Single Crystal Diamond AFM Probes for Noncontact/Tapping and Force Modulation Modes
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SNOM Test Grating
Test grating for scanning near-field optical microscopy.
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Diamond Probes
Single Crystal Diamond Coated Probes
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HA_FM Series
High Accuracy, Force Modulation AFM Probes
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HOPG
Highly Oriented Pyrolitic Graphite (HOPG) for SPM applications

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Nonconductive Noncontact/Tapping Probes
Standard AFM Probes for Nonconductive Noncontact/Tapping Modes
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Single Crystal Diamond (SCD)
The Single Crystal Diamond (SCD) probes have tips specially grown in a CVD process and glued to silicon cantilevers for use in AFM. This special growth technology provides durable and chemically inert probes with a high aspect ratio and small tip radius at an affordable price comparable to that of traditional silicon probes. The SCD tip usually has a sharp edge at the apex which makes it applicable for imaging flat surfaces with high resolution.
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AFM Calibration
K-Tek Nanotechnology supplies full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.
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HOPG
Highly Oriented Pyrolitic Graphite (HOPG) for SPM applications