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New Products

Active Vibration Isolation Systems
Active Vibration Isolation Systems for Inverted Microscopes
Vibration Absorption Systems
Vibration Absorption Systems for Optical Microscopes and Inverted Microscopes in IVF Labs
Scalloped Aluminum Grating
Scalloped Aluminum Grating for AFM reference and calibration standard in XY plane

Best Sellers

Nonconductive Noncontact/Tapping Probes
Standard AFM Probes for Nonconductive Noncontact/Tapping Modes
Single Crystal Diamond (SCD)
The Single Crystal Diamond (SCD) probes have tips specially grown in a CVD process and glued to silicon cantilevers for use in AFM. This special growth technology provides durable and chemically inert probes with a high aspect ratio and small tip radius at an affordable price comparable to that of traditional silicon probes. The SCD tip usually has a sharp edge at the apex which makes it applicable for imaging flat surfaces with high resolution.
AFM Calibration
K-Tek Nanotechnology supplies full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.
HOPG
Highly Oriented Pyrolitic Graphite (HOPG) for SPM applications