New Products

CTI Series
All-Diamond Probes: Contact Mode
MET Image
MET Series
Trench/high aspect ratio measurement AFM tips. Post shape AFM probe with carbon nanotube tip specifically engineered for critical metrology applications.
TN-HAR Image
TN-HAR Series
Long lasting AFM probe with carbon nanotube tip.
DLC Probes
Super Sharp Diamond-Like Carbon (DLC) Probes
HA_C Series
High Accuracy, Contact AFM Probes

Best Sellers

FN 5
FN Series
The NEW FN series gives you everything you need: low radius of curvature, high aspect ratio imaging and long life in a single probe.
HA_HR Series
High Accuracy, High Resonance, Noncontact AFM Probes
Single Crystal Diamond (SCD)
The Single Crystal Diamond (SCD) probes have tips specially grown in a CVD process and glued to silicon cantilevers for use in AFM. This special growth technology provides durable and chemically inert probes with a high aspect ratio and small tip radius at an affordable price comparable to that of traditional silicon probes. The SCD tip usually has a sharp edge at the apex which makes it applicable for imaging flat surfaces with high resolution.
AFM Calibration
K-Tek Nanotechnology supplies full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.