Your Source for High-Performance AFM Tips and Accessories
Grating set for SPM lateral and vertical calibration. This set includes TGZ1, TGZ2, TGZ3, TGX1, TGG1, and TGT1.
TGZ2
Description
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
TDG01
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
SU001
Polycrystalline Sapphire Substrate.
DNA01
Long-life, stable and non-destructing object for AFM.