Your Source for High-Performance AFM Tips and Accessories
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
TGZ1
Description
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
DNA01
Long-life, stable and non-destructing object for AFM.
PFM03
Test pattern for Piezoresponce Force Microscopy
TSD01