Your Source for High-Performance AFM Tips and Accessories
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
DNA01
Description
Long-life, stable and non-destructing object for AFM.
SU015
Universal Sample Holder with Electric Contact.
SiC/1.5
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
Mica/dia9.5
Chemical Vapor Deposition (CVD) method is an excellent solution for providing high quality characteristics, including imperviousness, high purity, perfect grain structure, stability, and increased hardness compared to other coating methods.