TDG01

$TDG - AFM Diffraction Grating$

$TDG - AFM Diffraction Grating$

TDG01

Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.

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Categories: AFM Accessories, AFM Calibration SKU:TDG01

Description

K-TEK Nanotechnology supplies the full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.

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Additional Information

Additional information

Structure	Glass Wafer. The grating is formed on the layer of chalcagenid glass. The grating top surface is aluminum (thickness 80-110 nm)
Pattern Types	1-Dimensional (in the X or Y direction)
Period	278 nm (3600 periods/mm)
Size	Diameter 12.5mm, thickness 2.5 mm
Effective Area	Central diameter 9 mm
Step Height	> 55 nm and provides good image contrast
Geometry	Parallel ridges
Accuracy	± 1 nm