Description
K-TEKNanotechnology supplies the full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.
TGQ1
TGQ1
TGQ calibration gratings are intended for simultaneous calibration in X, Y, and Z directions, lateral calibration of AFM scanners, and detection of lateral nonlinearity, hysteresis, creep and cross-coupling effects.
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