Your Source for High-Performance AFM Tips and Accessories
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
K-TEK Nanotechnology supplies the full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.
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Si wafer, the grating is formed on the layer of SiO2
1-Dimensional (Z-axis direction)
3.00 ± 0.05 µm
5 x 5 x 0.5 mm
Central square 3 x 3 mm
520 ± 20nm