Description
K-TEK Nanotechnology supplies the full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.
TGZ3
TGZ3
$110.00
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
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