TGT calibration gratings allow users to visualize scanning tips in 3-D, determine tip sharpness parameters (aspect ratio and curvature radius), tip degradation and contamination control.
Share this
Related products
-
Description
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
-
Description
TGX calibration gratings are intended for lateral calibration of AFM scanners, detection of lateral nonlinearity, hysteresis, creep and cross-coupling effects, and determination of the tip aspect ratio.
-
Description
Grating set for Z-axis SPM calibration with four different height ranges – 20nm, 110nm, 520nm, 1400nm. This set includes TGZ1, TGZ2, TGZ3, and TGZ4.
-
- Size 7 × 7 mm
- Quality ZYA
- Working Side Single
- Top Working Layer Mosaic Spread 0.3-0.5 degree
- Thickness of working layer2 0.6mm (0.4-0.7)