Your Source for High-Performance AFM Tips and Accessories
TGT calibration gratings allow users to visualize scanning tips in 3-D, determine tip sharpness parameters (aspect ratio and curvature radius), tip degradation and contamination control.
K-TEK Nanotechnology supplies the full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.
Click Here to Download a PDF With More Information
The grating is formed on Si wafer top surface
Array of sharp tips
70° ± 2°
≤ 10 nm
3.00 ± 0.05 µm
5 x 5 x 0.5 mm
Central square 3 x 3 mm
0.3 – 0.7 µm