Your Source for High-Performance AFM Tips and Accessories
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
PFM03
Description
Test pattern for Piezoresponce Force Microscopy
SU015
Universal Sample Holder with Electric Contact.
SU001
Polycrystalline Sapphire Substrate.
Grating set for Z-axis SPM calibration with three different height ranges – 20nm, 110nm, 520nm with PTB traceable certificate. This set includes TGZ1, TGZ2, and TGZ3.