Your Source for High-Performance AFM Tips and Accessories
TGG calibration gratings are intended for AFM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, and tip characterization.
K-TEK Nanotechnology supplies the full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.
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The grating is formed on Si wafer top surface
1-Dimensional array of triangular steps (X or Y direction) having precise linear and angular sizes
70° ± 2°
≤ 10 nm
3.00 ± 0.05 µm
5 x 5 x 0.5 mm
Central square 3 x 3 mm