AFM Accessories
Showing 13–24 of 60 results
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Description
Grating set for Z-axis SPM calibration with three different height ranges – 20nm, 110nm, 520nm. This set includes TGZ1, TGZ2, and TGZ3.
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Description
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
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- Size 10 ×10 mm
- Quality ZYA
- Working Side Double
- Top Working Layer Mosaic Spread 0.3-0.5 degree
- Thickness of working layer2 1.0 mm (0.8-1.8)
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Description
Grating set for SPM lateral and vertical calibration. This set includes TGZ1, TGZ2, TGZ3, TGX1, TGG1, and TGT1.
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Description
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
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Description
TGG calibration gratings are intended for AFM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, and tip characterization.
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Description
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
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Description
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
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- Size 10 ×10 mm
- Quality ZYH
- Working Side Double
- Top Working Layer Mosaic Spread 3.5 ± 1.0 degrees
- Thickness of working layer2 1.0 mm (0.8-1.8)
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- Size 10 ×10 mm
- Quality ZYH
- Working Side Double
- Top Working Layer Mosaic Spread 3.5 ± 1.0 degrees
- Thickness of working layer2 1.5mm
