Test pattern for Piezoresponce Force Microscopy
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Description
TGT calibration gratings allow users to visualize scanning tips in 3-D, determine tip sharpness parameters (aspect ratio and curvature radius), tip degradation and contamination control.
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Description
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
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Description
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
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- Size 7 × 7 mm
- Quality ZYA
- Working Side Single
- Top Working Layer Mosaic Spread 0.3-0.5 degree
- Thickness of working layer2 0.6mm (0.4-0.7)