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Showing 25–36 of 201 results
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- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Pt Conductive
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- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
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- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
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- Size 10 ×10 mm
- Quality ZYA
- Working Side Double
- Top Working Layer Mosaic Spread 0.3-0.5 degree
- Thickness of working layer2 1.0 mm (0.8-1.8)
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Description
Grating set for SPM lateral and vertical calibration. This set includes TGZ1, TGZ2, TGZ3, TGX1, TGG1, and TGT1.
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Description
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
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Description
TGG calibration gratings are intended for AFM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, and tip characterization.
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Description
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
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Description
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
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- Length 125
- Width 40
- Thickness 4
- Resonant Frequency kHz (min, typ, max) 200, 320, 440
- Force Constant (min, typ, max) 22, 40, 100
- Tip Shape Tetrahedral (Standard)
- Coating Al Reflective
