AFM Accessories
Showing 1–12 of 60 results
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- Size 10 ×10 mm
- Quality ZYB
- Working Side Single
- Top Working Layer Mosaic Spread 0.6-1.0 degree
- Thickness of working layer2 2.0mm
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Description
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
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- Size 7 × 7 mm
- Quality ZYB
- Working Side Single
- Top Working Layer Mosaic Spread 0.6-1.0 degree
- Thickness of working layer2 1.0 mm (0.8-1.8)
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- Size 7 × 7 mm
- Quality ZYH
- Working Side Single
- Top Working Layer Mosaic Spread 2-5 degree
- Thickness of working layer2 0.6mm (0.4-0.7)
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Description
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
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Description
TGQ calibration gratings are intended for simultaneous calibration in X, Y, and Z directions, lateral calibration of AFM scanners, and detection of lateral nonlinearity, hysteresis, creep and cross-coupling effects.
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- Size 10 ×10 mm
- Quality ZYB
- Working Side Double
- Top Working Layer Mosaic Spread 0.6-1.0 degree
- Thickness of working layer2 2.0mm
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- Size 10 ×10 mm
- Quality ZYA
- Working Side Double
- Top Working Layer Mosaic Spread 0.3-0.5 degree
- Thickness of working layer2 2.0mm
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Description
TGT calibration gratings allow users to visualize scanning tips in 3-D, determine tip sharpness parameters (aspect ratio and curvature radius), tip degradation and contamination control.
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- Size 7 × 7 mm
- Quality ZYB
- Working Side Single
- Top Working Layer Mosaic Spread 0.6-1.0 degree
- Thickness of working layer2 0.6mm (0.4-0.7)
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Description
Grating set for Z-axis SPM calibration with four different height ranges – 20nm, 110nm, 520nm, 1400nm. This set includes TGZ1, TGZ2, TGZ3, and TGZ4.
