Your Source for High-Performance AFM Tips and Accessories
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
DNA01
Description
Long-life, stable and non-destructing object for AFM.
TGT1
TGT calibration gratings allow users to visualize scanning tips in 3-D, determine tip sharpness parameters (aspect ratio and curvature radius), tip degradation and contamination control.
Grating set for Z-axis SPM calibration with three different height ranges – 20nm, 110nm, 520nm. This set includes TGZ1, TGZ2, and TGZ3.
Grating set for Z-axis SPM calibration with four different height ranges – 20nm, 110nm, 520nm, 1400nm. This set includes TGZ1, TGZ2, TGZ3, and TGZ4.