3.00 ± 0.05 µm

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Showing all 8 results

  • TGT1

    TGT1

    TGT1

    $330.00

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    Description

    TGT calibration gratings allow users to visualize scanning tips in 3-D, determine tip sharpness parameters (aspect ratio and curvature radius), tip degradation and contamination control.

  • TGQ1

    TGQ1

    TGQ1

    $330.00

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    Description

    TGQ calibration gratings are intended for simultaneous calibration in X, Y, and Z directions, lateral calibration of AFM scanners, and detection of lateral nonlinearity, hysteresis, creep and cross-coupling effects.

  • TGZ1

    TGZ1

    TGZ1

    $110.00

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    Description

    TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.

  • TGG1

    TGG1

    TGG1

    $220.00

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    Description

    TGG calibration gratings are intended for AFM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, and tip characterization.

  • TGX1

    TGX1

    TGX1

    $220.00

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    Description

    TGX calibration gratings are intended for lateral calibration of AFM scanners, detection of lateral nonlinearity, hysteresis, creep and cross-coupling effects, and determination of the tip aspect ratio.

  • TGZ4

    TGZ4

    TGZ4

    $110.00

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    Description

    TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.

  • TGZ3

    TGZ3

    TGZ3

    $110.00

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    Description

    TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.

  • TGZ2

    TGZ2

    TGZ2

    $110.00

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    Description

    TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.