Your Source for High-Performance AFM Tips and Accessories
Highly Oriented Pyrolitic Graphite (HOPG) for SPM applications
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
Long-life, stable and non-destructing object for AFM.