Related products

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  TGZ3

  TGZ3

  $115.00

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  Description

  TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.

• 

  PFM03

  PFM03

  $403.00

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  Description

  Test pattern for Piezoresponce Force Microscopy

• 

  SiC/0.75

  SiC/0.75

  $175.00

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  Description

  6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.

• 

  TGS1

  $280.00

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  Description

  Grating set for Z-axis SPM calibration with three different height ranges – 20nm, 110nm, 520nm. This set includes TGZ1, TGZ2, and TGZ3.