Test pattern for Piezoresponce Force Microscopy
Categories: AFM Accessories, Test Samples
SKU:PFM03
Related products
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- Size 7 × 7 mm
- Quality ZYA
- Working Side Single
- Top Working Layer Mosaic Spread 0.3-0.5 degree
- Thickness of working layer2 0.6mm (0.4-0.7)
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Description
TGG calibration gratings are intended for AFM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, and tip characterization.
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Description
Grating set for Z-axis SPM calibration with three different height ranges – 20nm, 110nm, 520nm. This set includes TGZ1, TGZ2, and TGZ3.
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Description
Chemical Vapor Deposition (CVD) method is an excellent solution for providing high quality characteristics, including imperviousness, high purity, perfect grain structure, stability, and increased hardness compared to other coating methods.