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TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
TSD01
Description
Long-life, stable and non-destructing object for AFM.
SiC/1.5
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
Full set of calibration standards for AFM simultaneous calibration in X, Y, and Z directions; submicron SPM calibration in X or Y direction; lateral and vertical calibration. This set includes TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, and TGQ1.
Grating set for Z-axis SPM calibration with four different height ranges – 20nm, 110nm, 520nm, 1400nm. This set includes TGZ1, TGZ2, TGZ3, and TGZ4.