Your Source for High-Performance AFM Tips and Accessories
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
SU015
Description
Universal Sample Holder with Electric Contact.
SiC/1.5
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
GR33_Cu
Chemical Vapor Deposition (CVD) method is an excellent solution for providing high quality characteristics, including imperviousness, high purity, perfect grain structure, stability, and increased hardness compared to other coating methods.
DNA01
Long-life, stable and non-destructing object for AFM.