6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
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Description
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
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Description
Chemical Vapor Deposition (CVD) method is an excellent solution for providing high quality characteristics, including imperviousness, high purity, perfect grain structure, stability, and increased hardness compared to other coating methods.
