Test pattern for Piezoresponce Force Microscopy
Categories: AFM Accessories, Test Samples
SKU:PFM03
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Description
Chemical Vapor Deposition (CVD) method is an excellent solution for providing high quality characteristics, including imperviousness, high purity, perfect grain structure, stability, and increased hardness compared to other coating methods.
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Description
TGX calibration gratings are intended for lateral calibration of AFM scanners, detection of lateral nonlinearity, hysteresis, creep and cross-coupling effects, and determination of the tip aspect ratio.
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- Size 7 × 7 mm
- Quality ZYA
- Working Side Single
- Top Working Layer Mosaic Spread 0.3-0.5 degree
- Thickness of working layer2 0.6mm (0.4-0.7)
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Description
Grating set for SPM lateral and vertical calibration. This set includes TGZ1, TGZ2, TGZ3, TGX1, TGG1, and TGT1.