Test pattern for Piezoresponce Force Microscopy
Categories: AFM Accessories, Test Samples
SKU:PFM03
Related products
-
Description
Grating set for SPM lateral and vertical calibration. This set includes TGZ1, TGZ2, TGZ3, TGX1, TGG1, and TGT1.
-
Description
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.