Your Source for High-Performance AFM Tips and Accessories
Highly Oriented Pyrolitic Graphite (HOPG) for SPM applications
Long-life, stable and non-destructing object for AFM.
Test pattern for Piezoresponce Force Microscopy
TGX calibration gratings are intended for lateral calibration of AFM scanners, detection of lateral nonlinearity, hysteresis, creep and cross-coupling effects, and determination of the tip aspect ratio.
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.