Your Source for High-Performance AFM Tips and Accessories
Highly Oriented Pyrolitic Graphite (HOPG) for SPM applications
Test pattern for Piezoresponce Force Microscopy
Polycrystalline Sapphire Substrate.
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.