Specialty Probes

K-Tek Nanotechnology offers a wide variety of specialty type AFM and SNOM/NSOM tips to fit all your research needs.

All-Diamond Probes
These probes provide fast imaging with a high rate of accuracy, as well as industry-leading durability and wear performance.
DCP Series
Diamond-Coated Conductive Probes
DLC Probes
Super Sharp Diamond-Like Carbon (DLC) Probes
Diamond Probes
Single Crystal Diamond Coated Probes
High Aspect Ratio SCD Probes
High Aspect Ratio Single Crystal Diamond AFM Probes for Noncontact/Tapping and Force Modulation Modes
Micro-Lensed Fibers
Micro-Lensed Fibres for Photonics Applications
Needleprobes
High Aspect Ratio Needleprobes
Optical Micro Tips
Optical Micro Tips for Near Field Microscopy (SNOM) applications
Single Crystal Diamond (SCD)
The Single Crystal Diamond (SCD) probes have tips specially grown in a CVD process and glued to silicon cantilevers for use in AFM. This special growth technology provides durable and chemically inert probes with a high aspect ratio and small tip radius at an affordable price comparable to that of traditional silicon probes. The SCD tip usually has a sharp edge at the apex which makes it applicable for imaging flat surfaces with high resolution.
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SNOM Probes
Scanning Near Field Optical Microscopes
Super Sharp
Super Sharp Silicon AFM Probes
SThM Probes
Complete Package for Scanning Thermal Microscopy (SThM) Testing
Top Visual Probes
Precision Silicon Cantilevers for Contact & Noncontact Mode
Whisker Probes
Specially Designed for Deep Holes, Trenches and Narrow Gaps