Your Source for High-Performance AFM Tips and Accessories
TGZ calibration grating series are intended for Z-axis calibration of scanning probe microscopes (SPM) and nonlinearity measurements.
PFM03
Description
Test pattern for Piezoresponce Force Microscopy
DNA01
Long-life, stable and non-destructing object for AFM.
SU015
Universal Sample Holder with Electric Contact.
SU001
Polycrystalline Sapphire Substrate.