Your Source for High-Performance AFM Tips and Accessories
Grating set for Z-axis SPM calibration with four different height ranges – 20nm, 110nm, 520nm, 1400nm. This set includes TGZ1, TGZ2, TGZ3, and TGZ4.
PFM03
Description
Test pattern for Piezoresponce Force Microscopy
SU001
Polycrystalline Sapphire Substrate.
SiC/0.75
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval.
TSD01
Long-life, stable and non-destructing object for AFM.