Long Lasting High Aspect Ratio AFM Probes with Carbon Nanotube Tip
Categories: AFM Probes, Carbon Nanotube
Tags:: Critical Dimension (CDAFM), Electrostatic Force Microscopy (EFM), Force Modulation, General Topography, Hardened/Enhanced Wear Resistance, High Aspect Ratio, Life Sciences, Non-Contact/Tapping, Phase Imaging Mode, Scanning Capacitance Mode (SCM), Surface Potential Microscopy (SPoM), Trenches/Holes
SKU:N/A
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- Length 135
- Width 30
- Thickness 1.5
- Resonant Frequency kHz 47, 90, 150
- Force Constant 0.35, 1.74, 6.1
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
-
- Length 100/130
- Width 35/35
- Thickness 2/2
- Resonant Frequency kHz 190, 255, 325/115, 150, 190
- Force Constant 5.5, 11.5, 22.5/2.5, 5.5, 10
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
-
- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating None
-
- Length 95
- Width 30
- Thickness 2
- Resonant Frequency kHz 140, 240, 390
- Force Constant 3.1, 11.8, 37.6
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective