Long Lasting High Aspect Ratio AFM Probes with Carbon Nanotube Tip
Categories: AFM Probes, Carbon Nanotube
Tags:: Critical Dimension (CDAFM), Electrostatic Force Microscopy (EFM), Force Modulation, General Topography, Hardened/Enhanced Wear Resistance, High Aspect Ratio, Life Sciences, Non-Contact/Tapping, Phase Imaging Mode, Scanning Capacitance Mode (SCM), Surface Potential Microscopy (SPoM), Trenches/Holes
SKU:N/A
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