Description
K-TEK Nanotechnology’s SThM probes provide better than 100nm lateral resolution with both thermal images and topography scans. Our specialized manufacturing system allows for high resistance at the tip apex.
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Scanning Thermal Microscopy Probes
K-TEK Nanotechnology’s SThM probes provide better than 100nm lateral resolution with both thermal images and topography scans. Our specialized manufacturing system allows for high resistance at the tip apex.
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