Silicon Nitride Sharp (SNS) AFM probes consist of a silicon nitride cantilever with low stiffness and a sharp silicon integrated tip.
Categories: AFM Probes, Golden
Tags:: Adhesion Force Imaging (Spectroscopy), Atomic Force Acoustic Microscopy (AFAM), Contact, Critical Dimension (CDAFM), Force Modulation, General Topography, High Resolution Imaging, Lateral Force Microscopy (LFM), Life Sciences, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Non-Contact/Tapping, Phase Imaging Mode, Spectroscopy, Torsional Resonance (TR), Trenches/Holes
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