Silicon Nitride Sharp (SNS) AFM probes consist of a silicon nitride cantilever with low stiffness and a sharp silicon integrated tip.
Categories: AFM Probes, Golden
Tags:: Adhesion Force Imaging (Spectroscopy), Atomic Force Acoustic Microscopy (AFAM), Contact, Critical Dimension (CDAFM), Force Modulation, General Topography, High Resolution Imaging, Lateral Force Microscopy (LFM), Life Sciences, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Non-Contact/Tapping, Phase Imaging Mode, Spectroscopy, Torsional Resonance (TR), Trenches/Holes
SKU:N/A
Related products
-
- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating TiN Conductive
-
- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
-
- Length 95
- Width 30
- Thickness 2
- Resonant Frequency kHz 140, 240, 390
- Force Constant 3.1, 11.8, 37.6
- Tip Shape Tetrahedral (Standard)
- Coating None
-
- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating None