Golden Silicon AFM Probes for Conductive Non-Contact Mode
Categories: AFM Probes, Golden
Tags:: Conductive AFM (CAFM), Electrical, Electrostatic Force Microscopy (EFM), Kelvin Probe Microscopy, Liquid Scanning, Piezoresponse/ Piezoforce Microscopy (PFM), Scanning Capacitance Mode (SCM), Scanning Spreading Resistance Mode (SSRM), Surface Potential Microscopy (SPoM)
SKU:N/A
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- Length 125
- Width 30
- Thickness 2
- Resonant Frequency kHz 87, 150, 230
- Force Constant 1.45, 5.1, 15.1
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
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- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating TiN Conductive
-
- Length 190
- Width 30
- Thickness 1.5
- Resonant Frequency kHz 26, 48, 76
- Force Constant 0.13, 0.6, 2
- Tip Shape Tetrahedral (Standard)
- Coating Pt Conductive
-
- Length 125
- Width 30
- Thickness 2
- Resonant Frequency kHz 87, 150, 230
- Force Constant 1.45, 5.1, 15.1
- Tip Shape Tetrahedral (Standard)
- Coating Pt Conductive