K-TEK Nanotechnology offers a new development – high resolution, long lifetime, magnetic AFM probes. The proper AFM probe is very important during magnetic measurements. Magnetic probes should provide high-resolution images and “survive” under high-humidity conditions. Our magnetic AFM probes have special protective layers to help avoid oxidation and increase cantilever lifetime. Sharp silicon tips with coatings less than 40 nm allow you to obtain 20-30 nm magnetic resolution. Low Moment high-resolution magnetic AFM probes have 15nm CoCr coating, which is two times thinner compared to standard MFM tips. Decreasing the magnetic moment of MFM tip is important in imaging low coercive magnetic samples, such as iron garnet films with coactivity of approximately 20 Oe.