High Aspect Ratio AFM Probes with Carbon Nanotube Tip Specially Designed for Critical Metrology Applications
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- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Au Conductive
-
- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
-
- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tipless
- Coating Au Reflective
-
- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating None