High Aspect Ratio AFM Probes with Carbon Nanotube Tip Specially Designed for Critical Metrology Applications
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- Length 135
- Width 30
- Thickness 1.5
- Resonant Frequency kHz 47, 90, 150
- Force Constant 0.35, 1.74, 6.1
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
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- Length 125
- Width 30
- Thickness 2
- Resonant Frequency kHz 87, 150, 230
- Force Constant 1.45, 5.1, 15.1
- Tip Shape Tetrahedral (Standard)
- Coating Au Conductive
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- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
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- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating TiN Conductive