High Accuracy, Conductive Contact-Noncontact/Tapping Etalon AFM Probes
Categories: AFM Probes, Etalon
Tags:: Conductive AFM (CAFM), Electrostatic Force Microscopy (EFM), Hardened/Enhanced Wear Resistance, High Aspect Ratio, Lateral Force Microscopy (LFM), Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Piezoresponse/ Piezoforce Microscopy (PFM), Scanning Capacitance Mode (SCM), Scanning Spreading Resistance Mode (SSRM), Surface Potential Microscopy (SPoM)
SKU:N/A
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- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Au Conductive
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- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
-
- Length 100/130
- Width 35/35
- Thickness 2/2
- Resonant Frequency kHz 190, 255, 325/115, 150, 190
- Force Constant 5.5, 11.5, 22.5/2.5, 5.5, 10
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
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- Length 95
- Width 30
- Thickness 2
- Resonant Frequency kHz 140, 240, 390
- Force Constant 3.1, 11.8, 37.6
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective