High Aspect Ratio AFM Probes with Carbon Nanotube Tip
Categories: AFM Probes, Carbon Nanotube
Tags:: Critical Dimension (CDAFM), Electrostatic Force Microscopy (EFM), Force Modulation, General Topography, Hardened/Enhanced Wear Resistance, High Aspect Ratio, High Resolution Imaging, Life Sciences, Non-Contact/Tapping, Phase Imaging Mode, Scanning Capacitance Mode (SCM), Surface Potential Microscopy (SPoM), Trenches/Holes
SKU:N/A
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- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Pt Conductive
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- Length 190
- Width 30
- Thickness 1.5
- Resonant Frequency kHz 26, 48, 76
- Force Constant 0.13, 0.6, 2
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
-
- Length 95
- Width 30
- Thickness 2
- Resonant Frequency kHz 140, 240, 390
- Force Constant 3.1, 11.8, 37.6
- Tip Shape Tetrahedral (Standard)
- Coating Au Conductive
-
- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Au Conductive