Unique Probes with Single Crystal Diamond Tip for Topography and Electrical Measurements
	
	Categories: AFM Probes, Diamond
	Tags:: Conductive AFM (CAFM), Electrical, Hardened/Enhanced Wear Resistance, Nanoindentation and Lithography
	
		SKU:DEP01/5
	
	
	
		
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- Length 135
 - Width 30
 - Thickness 1.5
 - Resonant Frequency kHz 47, 90, 150
 - Force Constant 0.35, 1.74, 6.1
 - Tip Shape Tetrahedral (Standard)
 - Coating Au Conductive
 
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- Length 225
 - Width 30
 - Thickness 1
 - Resonant Frequency kHz 8, 22, 39
 - Force Constant 0.01, 0.11, 0.5
 - Tip Shape Tetrahedral (Standard)
 - Coating Au Reflective
 
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- Length 350
 - Width 30
 - Thickness 1
 - Resonant Frequency kHz 4, 9.8, 17
 - Force Constant 0.003, 0.03, 0.13
 - Tip Shape Tetrahedral (Standard)
 - Coating Au Conductive
 
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- Length 350
 - Width 30
 - Thickness 1
 - Resonant Frequency kHz 4, 9.8, 17
 - Force Constant 0.003, 0.03, 0.13
 - Tip Shape Tipless
 - Coating Au Reflective
 
 






