Unique Probes with Single Crystal Diamond Tip for Topography and Electrical Measurements
Categories: AFM Probes, Diamond
Tags:: Conductive AFM (CAFM), Electrical, Hardened/Enhanced Wear Resistance, Nanoindentation and Lithography
SKU:DEP01/5
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- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating None
-
- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating TiN Conductive
-
- Length 125
- Width 30
- Thickness 2
- Resonant Frequency kHz 87, 150, 230
- Force Constant 1.45, 5.1, 15.1
- Tip Shape Tetrahedral (Standard)
- Coating Pt Conductive
-
- Length 190
- Width 30
- Thickness 1.5
- Resonant Frequency kHz 26, 48, 76
- Force Constant 0.13, 0.6, 2
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective