Golden Silicon AFM Probes for Nonconductive Contact Mode
Categories: AFM Probes, Golden
Tags:: Adhesion Force Imaging (Spectroscopy), Atomic Force Acoustic Microscopy (AFAM), Contact, General Topography, Lateral Force Microscopy (LFM), Life Sciences, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Spectroscopy
SKU:N/A
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- Length 95
- Width 30
- Thickness 2
- Resonant Frequency kHz 140, 240, 390
- Force Constant 3.1, 11.8, 37.6
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
-
- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
-
- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating None
-
- Length 90
- Width 60
- Thickness 2
- Resonant Frequency kHz 260, 420, 630
- Force Constant 28, 48, 91
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective