Cantilevers with Micron Spheres Attached to Tipless Probes
Categories: AFM Probes, Colloidal
Tags:: Contact, Lateral Force Microscopy (LFM), Liquid Scanning, Mechanical Properties/Force Curves, Non-Contact/Tapping, Phase Imaging Mode
SKU:CPN_SiO2-A/Au/5
Related products
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- Length 95
- Width 30
- Thickness 2
- Resonant Frequency kHz 140, 240, 390
- Force Constant 3.1, 11.8, 37.6
- Tip Shape Tetrahedral (Standard)
- Coating Au Conductive
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- Length 125
- Width 30
- Thickness 2
- Resonant Frequency kHz 87, 150, 230
- Force Constant 1.45, 5.1, 15.1
- Tip Shape Tetrahedral (Standard)
- Coating Au Conductive
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- Length 100/130
- Width 35/35
- Thickness 2/2
- Resonant Frequency kHz 190, 255, 325/115, 150, 190
- Force Constant 5.5, 11.5, 22.5/2.5, 5.5, 10
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective
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- Length 190
- Width 30
- Thickness 1.5
- Resonant Frequency kHz 26, 48, 76
- Force Constant 0.13, 0.6, 2
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective