Cantilevers with Micron Spheres Attached to Tipless Probes
Categories: AFM Probes, Colloidal
Tags:: Contact, Lateral Force Microscopy (LFM), Liquid Scanning, Mechanical Properties/Force Curves, Non-Contact/Tapping, Phase Imaging Mode
SKU:CPFM_SiO2-A/Au/5
Related products
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- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating Pt Conductive
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- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating None
-
- Length 135
- Width 30
- Thickness 1.5
- Resonant Frequency kHz 47, 90, 150
- Force Constant 0.35, 1.74, 6.1
- Tip Shape Tetrahedral (Standard)
- Coating Au Conductive
-
- Length 350
- Width 30
- Thickness 1
- Resonant Frequency kHz 4, 9.8, 17
- Force Constant 0.003, 0.03, 0.13
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective