Cantilevers with Micron Spheres Attached to Tipless Probes
Categories: AFM Probes, Colloidal
Tags:: Contact, Lateral Force Microscopy (LFM), Liquid Scanning, Mechanical Properties/Force Curves, Non-Contact/Tapping, Phase Imaging Mode
SKU:CPFM_SiO2-A/Au/5
Related products
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- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Au Conductive
-
- Length 95
- Width 30
- Thickness 2
- Resonant Frequency kHz 140, 240, 390
- Force Constant 3.1, 11.8, 37.6
- Tip Shape Tetrahedral (Standard)
- Coating None
-
- Length 225
- Width 30
- Thickness 1
- Resonant Frequency kHz 8, 22, 39
- Force Constant 0.01, 0.11, 0.5
- Tip Shape Tetrahedral (Standard)
- Coating Pt Conductive
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- Length 135
- Width 30
- Thickness 1.5
- Resonant Frequency kHz 47, 90, 150
- Force Constant 0.35, 1.74, 6.1
- Tip Shape Tetrahedral (Standard)
- Coating Au Reflective