Noncontact/Tapping Mode

Standard AFM Probes

Tapping mode is the most common AFM mode used for scanning in liquids or in ambient conditions. The cantilever intermittently contacts the surface and oscillates with sufficient amplitude which eliminates frictional forces. In non-contact mode the tip and the sample do not touch. The tip is typically 1 nm to 10 nm above the surface to get the best results. Non-contact mode is commonly used for measuring soft samples like organic thin film or biological samples to avoid contaminating the sample.

Standard AFM Probe
Bare Noncontact/Tapping AFM Probes
Standard AFM Bare Probes for Noncontact/Tapping Modes
Standard AFM Probe
Conductive Noncontact/Tapping Probes
Standard AFM Probes for Conductive Noncontact/Tapping Modes
Standard AFM Probe
Nonconductive Noncontact/Tapping Probes
Standard AFM Probes for Nonconductive Noncontact/Tapping Modes
Tipless Noncontact/Tapping Probes
Standard AFM Tipless Probes for Noncontact/Tapping Modes