Contact Mode

Standard AFM Probes

Contact mode is the easiest scanning technique for atomic force microscopy, yet it can allow you to achieve atomic and molecular resolution. The AFM probe is in constant contact with the sample which provides the highest quality scans. Contact mode AFM probes are best for scanning hard surfaces.

Standard AFM Probe
Bare Contact Probes
Standard AFM Bare Probes for Contact Mode
Standard AFM Probe
Conductive Contact Probes
Standard AFM Probes for Conductive Contact Mode
Standard AFM Probe
Nonconductive Contact Probes
Standard AFM Probes for Nonconductive Contact Mode
Tipless Contact Probes
Standard AFM Tipless Probes for Contact Mode