Standard Probes

AFM "Golden" Silicon probes

Our standard silicon AFM probes offer a wide range of scanning modes, resonant frequencies, force constants, and coating options suitable for all your AFM research needs. Cantilevers are available with and without reflective coating, as well as conductive and magnetic coating. Extremely sharp tips allow the user to obtain high-quality images of samples. Standard chip sizes make our probes compatible with most AFM manufacturers.

Bare Contact Probes
Standard AFM Bare Probes for Contact Mode
Conductive Contact Probes
Standard AFM Probes for Conductive Contact Mode
Nonconductive Contact Probes
Standard AFM Probes for Nonconductive Contact Mode
Tipless Contact Probes
Standard AFM Tipless Probes for Contact Mode
Bare Noncontact/Tapping Probes
Standard AFM Bare Probes for Noncontact/Tapping Modes
Conductive Noncontact/Tapping Probes
Standard AFM Probes for Conductive Noncontact/Tapping Modes
Nonconductive Noncontact/Tapping Probes
Standard AFM Probes for Nonconductive Noncontact/Tapping Modes
Probe Sets
Standard AFM Probe Sets
Tipless Noncontact/Tapping Probes
Standard AFM Tipless Probes for Noncontact/Tapping Modes
Conductive Force Modulation Probes
Standard AFM Probe for Conductive Force Modulation Mode
Nonconductive Force Modulation Probes
Standard AFM Probe for Nonconductive Force Modulation Mode
Magnetic Mode
High Resolution, Long Lifetime Magnetic Probes