Standard AFM Probes

AFM "Golden" Silicon Probes

Our standard silicon AFM probes offer a wide range of scanning modes, resonant frequencies, force constants, and coating options suitable for all of your AFM research needs. Cantilevers are available with and without reflective coating, as well as conductive and magnetic coating. Extremely sharp tips allow the user to obtain high-quality images of samples. Standard chip sizes make our standard AFM probes compatible with most AFM manufacturers.

Standard AFM Probe
Bare Contact Probes
Standard AFM Bare Probes for Contact Mode
Standard AFM Probe
Conductive Contact Probes
Standard AFM Probes for Conductive Contact Mode
Standard AFM Probe
Nonconductive Contact Probes
Standard AFM Probes for Nonconductive Contact Mode
Tipless Contact Probes
Standard AFM Tipless Probes for Contact Mode
Standard AFM Probe
Bare Noncontact/Tapping AFM Probes
Standard AFM Bare Probes for Noncontact/Tapping Modes
Standard AFM Probe
Conductive Noncontact/Tapping Probes
Standard AFM Probes for Conductive Noncontact/Tapping Modes
Standard AFM Probe
Nonconductive Noncontact/Tapping Probes
Standard AFM Probes for Nonconductive Noncontact/Tapping Modes
Standard AFM Probe
Conductive Force Modulation Probes
Standard AFM Probes for Conductive Force Modulation Mode
Standard AFM Probe
Nonconductive Force Modulation Probes
Standard AFM Probes for Nonconductive Force Modulation Mode
Standard AFM Probe
Magnetic Mode
High Resolution, Long Lifetime Magnetic AFM Probes
HA_NC AFM Probe
HA_FM Series
High Accuracy, Force Modulation AFM Probes
HA_NC AFM Probe
HA_HR Series
High Accuracy, High Resonance, Noncontact AFM Probes
HA_NC AFM Probe
HA_C Series
High Accuracy, Contact AFM Probes
HA_NC AFM Probe
HA_CNC Series
High Accuracy, Contact-Noncontact/Tapping AFM Probes
HA_NC AFM Probe
HA_NC Series
High Accuracy, Noncontact AFM Probes