SSR Series

All-Diamond Probes: Scanning Spreading Resistance Microscopy

$12,500.00

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Specifications

Cantilever
Length
Width
Thickness
Resonant Frequency kHz
Force Constant Nm
± 10μm
± 5μm
± 0.5μm
Min
Typical
Max
Min
Typical
Max
ND-SSCRS130 33 2.3 150 265 355 13 27 35
ND-SSCRL245 42 2.3 50 80 110 4 5.5 7
AD-SSCRS130 33 2.3 150 265 355 13 27 35
AD-SSCRL245 42 2.3 50 80 110 4 5.5 7

Cantilever Specifications
Coating 70 nm (± 10) reflective aluminum coating
Chip Pyrex (3.6 x 1.5 x 0.5 mm)
Curvature Nominally less than 3 degrees
Tip Specifications
Tip Geometry 3-sided Pyramid
Tip Height 5.7µm (±0.1)
Tip Offset (Setback) 9 μm
Tip Curvature Radius (Nom) Less than 50nm
Material UNCD
AFM Cantilevers & Chips: Dimensions & Specifications Comparison

NaDiaProbes are designed to fit most commercial AFM instruments. Below is a comparison of standard Silicon AFM probes dimensions and NaDiaprobe dimensions.

Standard Silicon AFM Probe
AFM cantilever and chip schematics representing approximate values for most of the standard Silicon AFM probes.

(Source: Nanoscience Instruments)

All-Diamond Probe
NaDiaProbe rectangular cantilever and chip schematics representing values for the NaDiaProbes.
NaDiaProbes-Product-Catalog_2014-specs-a

Additional Information

Shipping
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Standard Ground, 2-Day, Next Day options available.
Details Price QTY
ND-SSCRS-50
Series: ND-SSCRS
Tip Quantity: 50
$12,500.00
ND-SSCRL-50
Series: ND-SSCRL
Tip Quantity: 50
$12,500.00