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Highly Oriented Pyrolitic Graphite (HOPG) for SPM applications
TGQ calibration gratings are intended for simultaneous calibration in X, Y, and Z directions, lateral calibration of AFM scanners, and detection of lateral nonlinearity, hysteresis, creep and cross-coupling effects.
Test pattern for Piezoresponce Force Microscopy
Grating set for Z-axis SPM calibration with three different height ranges – 20nm, 110nm, 520nm with PTB traceable certificate. This set includes TGZ1, TGZ2, and TGZ3.
Polycrystalline Sapphire Substrate.