DYI Series

All-Diamond Probes: Dynamic Mode

$7,500.00

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Specifications

Cantilever
Length
Width
Thickness
Resonant Frequency kHz
Force Constant Nm
± 10μm
± 5μm
± 0.5μm
Min
Typical
Max
Min
Typical
Max
ND-DYI135 33 3 150 310 400 25 35 40

Cantilever Specifications
Coating 70 nm (± 10) reflective aluminum coating
Chip Pyrex (3.6 x 1.5 x 0.5 mm)
Curvature Nominally less than 3 degrees
Tip Specifications
Tip Geometry 4-sided Pyramid
Tip Height 5.7µm (±0.1)
Tip Offset (Setback) 8.5 μm (± 4.0 μm)
Tip Curvature Radius (Nom) Less than 50nm
Material UNCD (polycrystalline diamond)
AFM Cantilevers & Chips: Dimensions & Specifications Comparison

NaDiaProbes are designed to fit most commercial AFM instruments. Below is a comparison of standard Silicon AFM probes dimensions and NaDiaprobe dimensions.

Standard Silicon AFM Probe
AFM cantilever and chip schematics representing approximate values for most of the standard Silicon AFM probes.

(Source: Nanoscience Instruments)

All-Diamond Probe
NaDiaProbe rectangular cantilever and chip schematics representing values for the NaDiaProbes.
NaDiaProbes-Product-Catalog_2014-specs-a

Additional Information

Shipping
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Details Price QTY
ND-DYIRS-50
Order Code:
Product Tip Quantity: 50
$7,500.00