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DYC Series

All-Diamond Probes: Conductive Dynamic Mode

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Specifications

Cantilever
Length
Width
Thickness
Resonant Frequency kHz
Force Constant Nm
± 10μm
± 5μm
± 0.5μm
Min
Typical
Max
Min
Typical
Max
ND-DYC135 33 3 150 310 400 25 35 40
AD-DYC (Sharp)135 33 3 150 300 400 30 35 45

Cantilever Specifications
Coating 70 nm (± 10) reflective aluminum coating
Chip Pyrex (3.6 x 1.5 x 0.5 mm)
Curvature Nominally less than 3 degrees
Tip Specifications
ND-DYC AD-DYC
Tip Geometry 4-sided Pyramid 4-sided Apex (Cone spike)
Tip Height 5.7µm (±0.1) 5.7µm (±0.1)
Tip Offset (Setback) 8.5 μm (± 4.0 μm) 8.5 μm (± 4.0 μm)
Radius Less than 50nm Less than 10nm
Material Conductive UNCD Conductive UNCD
AFM Cantilevers & Chips: Dimensions & Specifications Comparison

NaDiaProbes are designed to fit most commercial AFM instruments. Below is a comparison of standard Silicon AFM probes dimensions and NaDiaprobe dimensions.

Standard Silicon AFM Probe
AFM cantilever and chip schematics representing approximate values for most of the standard Silicon AFM probes.

(Source: Nanoscience Instruments)

All-Diamond Probe
NaDiaProbe rectangular cantilever and chip schematics representing values for the NaDiaProbes.
NaDiaProbes-Product-Catalog_2014-specs-a

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